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1

Methods and Ways of Piezoelectric Accelerometers Fastening on the Objects of Research

100%

Korobiichuk I., Bezvesilna O., Kachniarz M., Koshovyj M., Kvasnikov V.

Acta Physica Polonica A

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2018

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vol. 133

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issue 4

1112-1115

EN

Methods and ways of piezoelectric measuring converters fastening on the objects of research are considered in the article. Piezoelectric accelerometers are sensors of a contact type, they have a mechanical contact with the object of research. The peculiarity of such connection is the fact that the object immediately has an influence on the output signal of the accelerometer. Therefore, study of methods and ways of piezoelectric accelerometers fastening on the objects of research is, undoubtedly, topical. Their advantages and disadvantages are specified. Recommendations about the choice of the way of piezoelectric measuring converters fastening on the objects of research depending on the operating conditions are made.

2

Relative Reflection Difference as a Method for Measuring the Thickness of the Exfoliated MoSe₂ Layers

100%

Łempicka K., Norowski K., Grzeszczyk M., Król M., Lekenta K., Babiński A., Piętka B., Szczytko J.

Acta Physica Polonica A

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2017

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vol. 132

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issue 2

316-318

EN

We propose a method for measuring the thickness of the exfoliated MoSe₂ layers deposited on Si/SiO₂ substrate, based on the reflectance measurements performed with laser light illumination at two different wavelengths: red and green from confocal microscope at room temperature. We demonstrate the correlation between the number of layers in a flake and the value of its relative reflection difference. We applied the transfer matrix method to calculate the reflectivity and verify our experimental results. The approach proposed by us allows for fast and automatic verification of the exfoliated MoSe₂ layers thickness on large areas of the substrate.

3

Confocal Microscope Studies of MoS_{2} Layer Thickness

100%

Grzeszczyk M., Gołasa K., Piętka B., Babiński A., Szczytko J.

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vol. 126

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issue 5

1207-1208

EN

We have been studying micro-luminescence of various exfoliated MoS_{2} flakes using a confocal microscope. A crucial issue is to determine thickness of the investigated layer. The common way - using atomic force microscopy, electron microscopy or the Raman spectroscopy - requires moving the sample out from the confocal microscope experimental setup and looking for a particular exfoliated flake hidden among thousands of others. In order to preliminarily determine thickness of investigated layers we have performed a study on optical reflectivity and compared the results with the Raman spectroscopy investigations. In this way we were able to calibrate our experimental setup. Optical measurements are much faster than the Raman spectroscopy and can give a good estimation of MoS_{2} thickness.

4

Optical Absorption and Raman Scattering Studies of Few-Layer Epitaxial Graphene Grown on 4H-SiC Substrates

88%

Grodecki K., Drabińska A., Bożek R., Wysmołek A., Korona K., Strupiński W., Borysiuk J., Stępniewski R., Baranowski J.

Acta Physica Polonica A

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2009

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vol. 116

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issue 5

835-837

EN

Optical absorption and Raman scattering studies of few-layer epitaxial graphene obtained by high temperature annealing of carbon terminated face of 4H-SiC(000-1) on-axis substrates are presented. Changing the pressure and annealing time, different stages of the graphene formation were achieved. Optical absorption measurements enabled us to establish average number of graphene layers covering the SiC substrate. Raman scattering experiments showed that integrated intensity of the characteristic 2D peak positively correlated with the number of graphene layers deposited on the SiC substrate. The spectral width of the 2D peak was found to decrease with the number of the deposited graphene layers.

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4 Acta Physica Polonica A

1 2018

1 2017

1 2014

1 2009

2 Babiński A.

2 Grzeszczyk M.

2 Piętka B.

2 Szczytko J.

1 Baranowski J.

1 Bezvesilna O.

1 Borysiuk J.

1 Bożek R.

1 Drabińska A.

1 Gołasa K.

1 Grodecki K.

1 Kachniarz M.

1 Korobiichuk I.

1 Korona K.

1 Koshovyj M.

1 Król M.

1 Kvasnikov V.

1 Lekenta K.

1 Norowski K.

1 Strupiński W.

1 Stępniewski R.

1 Wysmołek A.

1 Łempicka K.

Methods and Ways of Piezoelectric Accelerometers Fastening on the Objects of Research

Relative Reflection Difference as a Method for Measuring the Thickness of the Exfoliated MoSe₂ Layers

Confocal Microscope Studies of MoS_{2} Layer Thickness

Optical Absorption and Raman Scattering Studies of Few-Layer Epitaxial Graphene Grown on 4H-SiC Substrates