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EN
An experimental apparatus is devised to measure the interaction between two spheres separated by a small gap in a uniform electric field. The results show that the interaction between two conducting spheres is near that between two dielectric spheres with high permittivity. Accordingly, the calculation can be simplified by mirror image method, for it is only available for conducting system. A method using multiple mirror images of point charges is put forward to analyze the induction of two identical conducting spheres in a uniform electric field. The key operation on how to add compensative charges is emphasized and given out in detail. The results from experiment and calculation are compared, and they agree with each other very well.
EN
In the paper, application of the Trefftz complete functions and Kupradze functions in two variational formulations is compared. They are applied in the original formulation and in the inverse one to the solution of boundary value problems of two-dimensional Laplace's equation. In these formulations, both solution and weighting functions are assumed to be of the same type, either the Trefftz function or the Kupradze function. Thus Galerkin versions of the methods are considered. All methods lead to the BEM and they are nonsingular. The relationship between the groups of methods of the original and inverse formulations is noticed. Numerical experiments are conducted for the Motz's problem. The accuracy and simplicity of the methods are discussed. All methods give comparable results. Since they are nonsingular, they may be successfully applied to solving boundary problems.
EN
The numerical method of the effective refractive index of porous composite materials calculation was improved by implementation of microlevel cellular structural models. The proposed solution gives the ability uniformly to analyse complex structural inhomogeneities and to synthesize the corresponding index based on the simulation of electrostatic field. The proposed realization is simpler and takes less computations capacities in comparison to analogous simulation methods. The method was probed on the example of SiO₂ nanoporous matrix with refractive index n=1.426 at λ=2.71 μm wavelength. The results of simulation are in good agreement with other analytical models from literature.
EN
Rectangular microstrip structures are widely used in various microwave devices. Using the method of moments and principle of partial images, various techniques are developed to determine charge distribution in 2D models of microstrip structures (their cross-section). In this paper, a technique for calculating surface charge distribution and total capacitance of complex 3D rectangular microstrip structures is proposed using the mentioned method and principle. To demonstrate feasibility of the proposed technique, five rectangular microstrip structures were investigated. Obtained results are compared with the data published by other researchers. Total error is typically in 6-12% range.
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