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A Fully Computerized Scanning Tunnelling Microscope

100%

Chwiałkowski M., Klusek Z., Kobierski P., Olejniczak W., Sławski M., Witek A.

Acta Physica Polonica A

1993

vol. 83

issue 5

621-628

A new, fully computerized and inexpensive, scanning tunnelling microscope was designed and built. Its key design feature is the application of the high sensitivity bimorph, for the coarse positioning of the bimorph is > 0.03 mm and can be divided up to the 12 bit number of steps. The bimorph positioning implies that this microscope is fully computer controlled, and using of bimorph instead of inch-worm implies low cost of the unit. The microscope can create images of the surface in the constant current mode and in the imaging current mode. The presented microscope works with the z-axis analog or digital feedback loop optionally. All parameters of the analog and digital feedback loop are computer controlled. Due to the digital z-axis feedback loop benefits, electron tunneling spectroscopy mode is naturally accessible. The performance of the microscope was tested in air by imaging of surface of HOPG (high oriented pyrolytic graphite).

The Transmission of the Electron Analyzers Determined by Elastic Peak Electron Spectroscopy

51%

Gruzza B., Bondot P., Porte A., Jardin C., Gergely G.

Acta Physica Polonica A

1992

vol. 81

issue 1

159-164

Using the elastic peak electron spectroscopy (EPES), the transmission functions were determined for the 4-grid retarding field and the hemispherical analyzers, which are commonly used for surface physics experiments.

Oxidation of Polycrystalline Chromium between 30°C and 400°C

51%

Thurner G., Holloway P.

Acta Physica Polonica A

1992

vol. 81

issue 2

273-283

The formation of coalesced oxide films on atomically clean polycrystalline chromium has been studied with Auger electron spectroscopy and secondary ion mass spectrometry at temperatures between 30°C and 400°C. The data are consistent with an initialed chemisorption of oxygen on the clean Cr followed by nucleation of chromium oxide after 2 L of exposure followed by lateral growth to form a thin, coalesced, saturated oxide film about 0.8 nm thick at 30°C. The saturated oxide was thicker at higher temperatures, being about 80 nm thick at 400°C. Detection of a CrO^{+} secondary ion was associated with chemisorbed oxygen, while O¯ ion originated from chromium oxides based upon correlation with chemical changes in the low-energy Auger spectra. Keating of the coalesced oxide caused considerable changes in both the low-energy Auger spectrum as well as the secondary ion emission. Both these as well as time-dependent, reversible changes in secondary ion emission were interpreted as structural rearrangements of the chromium oxide resulting in relative changes of oxygen either adsorbed on the surface or incorporated into chromium oxide.

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3 Acta Physica Polonica A

1 1993

2 1992

1 Bondot P.

1 Chwiałkowski M.

1 Gergely G.

1 Gruzza B.

1 Holloway P.

1 Jardin C.

1 Klusek Z.

1 Kobierski P.

1 Olejniczak W.

1 Porte A.

1 Sławski M.

1 Thurner G.

1 Witek A.

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A Fully Computerized Scanning Tunnelling Microscope

The Transmission of the Electron Analyzers Determined by Elastic Peak Electron Spectroscopy

Oxidation of Polycrystalline Chromium between 30°C and 400°C