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EN
PbSnS thin films were prepared by hot-wall vacuum evaporation. The Rutherford backscattering technique was employed for the investigation of Pb_{x}Sn_{1 - x}S thin films composition. With a help of atomic force microscopy the main stages in the development of the thin films were characterized. Contact angle measurements of water drop on Pb_{x}Sn_{1 - x}S thin films have been conducted on our original setup.
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EN
In that report we observe the initial stages in the process of film growth at different irradiation doses. Investigations of influence of Mo deposition on glass substrates by means of self-ion-assisted deposition on its topography (atomic force microscopy) and wettability (sessile-drop method) were carried out. It was found out that with an increase of the irradiation dose, the average roughness and the contact angle increases rapidly at first and then decrease. 2.45-2.77 increase in the contact angle of water when Mo-based coating was deposited on the glass was observed.
EN
The investigation of influence of Xe^{+} ions irradiation of graphite on its surface topography and wettability was conducted. With the increase of the irradiation dose, the roughness average increases rapidly at first (when the sample was irradiated at the dose of 1 × 10^{14} cm^{-2}) and then decreases slowly. The atomic force microscopy three-dimensional pictures showed that after irradiation of graphite of Xe^{+} ions with a dose of 3 × 10^{15} cm^{-2} hemispherical grains (from 0.2 to 0.8 μm in diameter) appear on its surface. Surface water contact angle measurement showed that irradiation of graphite by Xe^{+} ions leads to a hydrophobic surface of graphite. We have observed that irradiation of graphite by Xe^{+} ions can be used for obtaining graphite surface with desirable topography and water wettability.
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