In the article the results of the research aimed at the recognition of the correlation between the Ni-Fe film thickness and its magnetic domain structures are described. Magnetic thin films were prepared by pulse magnetron sputtering. Obtained thin film thicknesses were in the range of 47.6-326.0 nm. Magnetic domain structures were imaged using magnetic force microscopy. In order to obtain quantitative description of magnetic domains images, the algorithms designed for topography parameters determination were applied, enabling the comparison of specific factors related to the magnetic properties of the samples. Utilized approach provided the analysis of the impact of sputtering parameters on the morphological and magnetic properties of obtained films.
A novel description of hysteresis phenomenon is presented. The examined description emphasizes the roles of bistability and quantum phenomena as processes responsible for hysteresis loop formation in magnetic materials. Major and symmetric minor hysteresis loops are modelled in chosen soft magnetic materials using the Harrison model. A reasonable agreement between theory and experiment is achieved.
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