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Archives of Electrical Engineering
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2011
Authors
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Crevecoeur G.
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Dupré L.
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Gawrylczyk K.
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Putek P.
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Slodička M.
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van Keer R.
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Two-level approach for solving the inverse problem of defects identification in Eddy Current Testing - type NDT
100%
Putek P.
,
Crevecoeur G.
,
Slodička M.
,
Gawrylczyk K.
,
van Keer R.
,
Dupré L.
Archives of Electrical Engineering
|
2011
|
vol.
60
|
issue
4
Page
/ 1
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