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Two-Probe Measurements of Electron Transport in GaN:Si/(Ga,Mn)N/GaN:Si Spin Filter Structures

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Kalbarczyk K., Foltyn M., Grzybowski M., Stefanowicz W., Adhikari R., Li T., Kruszka R., Kamińska E., Piotrowska A., Bonanni A., Dietl T., Sawicki M.

Acta Physica Polonica A

2016

vol. 130

issue 5

1196-1198

Results of two-probe magnetoresistance studies in GaN:Si/(Ga,Mn)N/GaN:Si prospective spin filter structures are reported. It is postulated that transport characteristics are strongly influenced by highly conductive threading dislocations and that shrinking of the device size partially mitigates the issue. Simultaneously, maxima at ≈1500 Oe on overall weak, up to 2%, negative magnetoresistance are seen at low temperature, whose origin has been tentatively assigned to effects taking place at the contacts areas.

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1 Acta Physica Polonica A

1 2016

1 Adhikari R.

1 Bonanni A.

1 Dietl T.

1 Foltyn M.

1 Grzybowski M.

1 Kalbarczyk K.

1 Kamińska E.

1 Kruszka R.

1 Li T.

1 Piotrowska A.

1 Sawicki M.

1 Stefanowicz W.

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Two-Probe Measurements of Electron Transport in GaN:Si/(Ga,Mn)N/GaN:Si Spin Filter Structures