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THz Time Domain Spectroscopy of Thin Gold Layers on GaAs

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Szczytko J., Adomavicius R., Papis E., Barańska A., Wawro A., Krotkus A., Piętka B., Łusakowski J.
Acta Physica Polonica A
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2012
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vol. 122
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issue 6
1118-1120
EN
Thin layers of Au with the thickness of several nanometers were prepared on a semi-insulating GaAs substrate. The layers' thickness was determined by ellipsometry. THz time-domain spectroscopy was applied to determine a complex index of refraction of thin Au layers. The obtained results allow for a more precise modeling of the performance of semiconductor devices at THz frequencies.
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