The peak coincidence counting rate F(T) was measured for Sn-54wt%In alloy at the temperature range from room temperature to 400°C. It was observed that for both heating and cooling run, F(Τ) parameter changes in the liquid phase. These changes were related to disintegration of SnII microcrystals. From a simple trapping model the defect disintegration enthalpy, H_{1}, was calculated. For heating and cooling run, the value of H_{1} was 0.53 ± 0.03 eV and 0.67 ± 0.07 eV, respectively. For well-annealed and cold rolled samples we find only one component, equal 200 ps, in the lifetime spectrum.
The peak counting rate, F(T), for Bi_{40}Sn_{60} alloy in the temperature range from room temperature to 400°C was measured in three consecutive heating-cooling runs. Significant changes in F(T) were observed in the temperature interval between the solidus and liquidus temperature. The magnitude of these anomalies systematically diminishes in consecutive heating-cooling runs. Noticeable changes of values of F(T) parameter in the liquid alloy were observed, too. These effects were connected with trapping of positrons at the grain boundaries-defects and in the short-range ordered regions in the liquid alloy. Also microscopic structure of sample before and after measurements cycles was observed.
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