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Journals
4
Metrology and Measurement Systems
Years
1
2021
2
2020
1
2014
Authors
4
Gotszalk T.
3
Majstrzyk W.
2
Kunicki P.
2
Orłowska K.
2
Piasecki T.
2
Pruchnik B.
2
Sierakowski A.
2
Świątkowski M.
1
Babij M.
1
Badura D.
1
Dzierka A.
1
Gacka E.
1
Gajewski K.
1
Janus P.
1
Kopiec D.
1
Kwoka K.
1
Mognaschi M. E.
1
Podgórni A.
1
Rudek M.
1
Sankowska A.
1
Słupski P.
1
di Barba P.
1
Świadkowski B.
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Full text local access
Wide-Band Optical Fibre System for Investigation of MEMS and NEMS Deflection
100%
Orłowska K.
,
Świątkowski M.
,
Kunicki P.
,
Słupski P.
,
Sankowska A.
,
Gotszalk T.
Metrology and Measurement Systems
|
2014
|
issue
3
2
Full text local access
Metrology and control of electromagnetically actuated cantilevers using optical beam deflection method
95%
Kopiec D.
,
Majstrzyk W.
,
Pruchnik B.
,
Gacka E.
,
Badura D.
,
Sierakowski A.
,
Janus P.
,
Gotszalk T.
,
Kopiec D.
,
Majstrzyk W.
,
Pruchnik B.
,
Gacka E.
,
Badura D.
,
Sierakowski A.
,
Janus P.
,
Gotszalk T.
Metrology and Measurement Systems
|
2021
|
vol.
28
|
issue
4
3
Full text local access
ARMScope – the versatile platform for scanning probe microscopy systems
83%
Świadkowski B.
,
Piasecki T.
,
Rudek M.
,
Świątkowski M.
,
Gajewski K.
,
Majstrzyk W.
,
Babij M.
,
Dzierka A.
,
Gotszalk T.
,
Świadkowski B.
,
Piasecki T.
,
Rudek M.
,
Świątkowski M.
,
Gajewski K.
,
Majstrzyk W.
,
Babij M.
,
Dzierka A.
,
Gotszalk T.
Metrology and Measurement Systems
|
2020
|
vol.
27
|
issue
1
4
Full text local access
A method of magnetic field measurement in a scanning electron microscope using a microcantilever magnetometer
72%
Orłowska K.
,
Mognaschi M. E.
,
Kwoka K.
,
Piasecki T.
,
Kunicki P.
,
Sierakowski A.
,
Majstrzyk W.
,
Podgórni A.
,
Pruchnik B.
,
di Barba P.
,
Gotszalk T.
,
Orłowska K.
,
Mognaschi M. E.
,
Kwoka K.
,
Piasecki T.
,
Kunicki P.
,
Sierakowski A.
,
Majstrzyk W.
,
Podgórni A.
,
Pruchnik B.
,
di Barba P.
,
Gotszalk T.
Metrology and Measurement Systems
|
2020
|
vol.
27
|
issue
1
Page
/ 1
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