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The Fast Differential Amplifier-Based Integrated Circuit Yield Analysis Technique

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Baskys A., Navickas R., Simkevicius C.

Acta Physica Polonica A

2011

vol. 119

issue 2

259-261

The fast differential amplifier-based integrated circuit yield analysis technique, which enables determining the interrelation between the integrated circuit yield and dimensions of circuit elements, has been presented. The technique is based on the common use of experimental statistical analysis and statistical modeling as well as on the introduction of the concept of the integrated circuit intermediate parameters. The results of yield analysis of the concrete integrated circuit based on the differential amplifiers are presented.

Phase Noise Minimization in CMOS Voltage Controlled Oscillators

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Charlamov J., Navickas R., Baskys A.

Acta Physica Polonica A

2011

vol. 119

issue 2

234-236

Relaxation RC type voltage controlled oscillator is more desirable for many applications because of wide frequency generation range, small size on chip and linear voltage to frequency transfer characteristic. The limiting factor of such voltage controlled oscillator type is that it has higher phase noise in comparison with liquid crystal oscillators. We discuss how different device components, parameters and configuration influence phase noise, including transistor noise sources dependence on its geometrical parameters. The simulation results of the relaxation voltage controlled oscillator which was implemented in different 180 nm and 90 nm CMOS technologies are reported.

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2 Acta Physica Polonica A

2 2011

2 Baskys A.

2 Navickas R.

1 Charlamov J.

1 Simkevicius C.

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The Fast Differential Amplifier-Based Integrated Circuit Yield Analysis Technique

Phase Noise Minimization in CMOS Voltage Controlled Oscillators