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Electrical Characterization of Semiconducting Polymers

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Stallinga P., Gomes H., Jones G., Taylor D.
Acta Physica Polonica A
|
1998
|
vol. 94
|
issue 3
545-548
EN
Schottky diodes resulting from an intimate contact of aluminum on electrodeposited poly(3-methylthiopene) were studied by admittance spectroscopy, capacitance-voltage measurements and voltaic and optically-induced current and capacitance transients. The loss tangents show the existence of interface states that can be removed by vacuum annealing. Furthermore, the C-V curves contradict the idea of movement of the dopant ions.
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