Results of two-probe magnetoresistance studies in GaN:Si/(Ga,Mn)N/GaN:Si prospective spin filter structures are reported. It is postulated that transport characteristics are strongly influenced by highly conductive threading dislocations and that shrinking of the device size partially mitigates the issue. Simultaneously, maxima at ≈1500 Oe on overall weak, up to 2%, negative magnetoresistance are seen at low temperature, whose origin has been tentatively assigned to effects taking place at the contacts areas.
Thin-film structures composed of two kinds of ferromagnetic material - metallic Fe and semiconducting (Ga,Mn)As - were investigated by means of SQUID magnetometry and ferromagnetic resonance spectroscopy. Dependence of remnant magnetic moment on temperature showed unexpected anisotropic features when recorded along two orthogonal in-plane directions. For one of these orientations, the change in sign of the slope of m(T) curve at the Curie point of (Ga,Mn)As was observed, while for the other, an analogous m(T) curve retained monotonic character. Based on the comparison with ferromagnetic resonance data, the apparent non-monotonicity was attributed to the temperature-induced change of balance between the external magnetic field and uniaxial magnetic anisotropy in the plane of Fe layer.
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