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Light-Emitting Diode Degradation and Low-Frequency Noise Characteristics

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Šaulys B., Matukas J., Palenskis V., Pralgauskaitė S., Kulikauskas G.
Acta Physica Polonica A
|
2011
|
vol. 119
|
issue 4
514-520
EN
Comprehensive investigation of phosphide-based red and nitride-based blue light-emitting diodes characteristics and physical processes that take place in device structure during aging has been carried out. Analysis of noise characteristics (the emitting-light power and the LED voltage fluctuations, also their cross-correlation factor) shows that investigated LEDs degradation is caused by defects that lead to the leakage current and non-radiating recombination increase in the active region or its interfaces. Appearance of the defects first of all manifests in noise characteristics: intensive and strongly correlated 1/f^{α} type optical and electrical fluctuations come out.
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