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Journals
4
Metrology and Measurement Systems
Years
1
2014
2
2013
1
2012
Authors
4
Lentka G.
1
Hasse L.
1
Hoja J.
1
Kaczmarek L.
1
Kowalewski M.
1
Olesz M.
1
Smulko J.
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Full text local access
Using A Particular Sampling Method for Impedance Measurement
100%
Lentka G.
Metrology and Measurement Systems
|
2014
|
issue
3
2
Full text local access
Fast High-Impedance Spectroscopy Method Using Sinc Signal Excitation
84%
Kowalewski M.
,
Lentka G.
Metrology and Measurement Systems
|
2013
|
issue
4
3
Full text local access
A Family of New Generation Miniaturized Impedance Analyzers for Technical Object Diagnostics
84%
Hoja J.
,
Lentka G.
Metrology and Measurement Systems
|
2013
|
issue
1
4
Full text local access
Problems of Varistor Quality Assessment During Exploitation
60%
Smulko J.
,
Olesz M.
,
Hasse L.
,
Kaczmarek L.
,
Lentka G.
Metrology and Measurement Systems
|
2012
|
issue
2
Page
/ 1
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