X-ray absorption spectroscopy, today widely used as a tool for structural investigations, is described. Theoretically it is shown that above an absorption edge the absorption coefficient is well approximated by a sum of terms, each one describing a particular path followed by the photoelectron outgoing from the atom. Such geometrical feature allows to use X-ray absorption spectroscopy for structural investigations. The data analysis procedures are outlined. Applications of the single scattering region, generally known as EXAFS to semiconductors alloys, to metallic clusters and to the crystallization of amorphous metallic glasses are illustrated. Multiple scattering calculations and their relation to experimental spectra is discussed in the case of Mn ions in solution. Application of the multiple scattering to determine the three-body correlation function in a-Si:H is shown.
The X-ray bremsstrahlung isochromat of Fe was measured for the photon energy 5415 eV in an extended energy range up to 300 eV above the threshold and compared to the Fe K-edge X-ray absorption spectrum. The Fourier analysis was performed for both spectra. It was stated that the extended structure of the Fe bremsstrahlung isochromat is clearly visible and is characteristic of the Fe bcc structure. Using the beat-node method, the distance between first and second shells in the bcc Fe was obtained quite close to the crystallographic value.
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