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Journals
3
Metrology and Measurement Systems
1
International Journal of Electronics and Telecommunications
Years
1
2021
1
2020
1
2013
1
2010
Authors
4
Dudzik S.
1
Baran J.
1
Dudek G.
1
Szeląg P.
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Approximation of Thermal Background Applied to Defect Detection using the Methods of Active Thermography
100%
Dudzik S.
Metrology and Measurement Systems
|
2010
|
issue
4
2
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Characterization of Material Defects Using Active Thermography and an Artificial Neural Network
100%
Dudzik S.
Metrology and Measurement Systems
|
2013
|
issue
3
3
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Detection of thinning of homogeneous material using active thermography and classification trees
71%
Dudzik S.
,
Dudek G.
,
Dudzik S.
,
Dudek G.
Metrology and Measurement Systems
|
2021
|
vol.
28
|
issue
1
4
Full text local access
Research Studio for Testing Control Algorithms of Mobile Robots
54%
Dudzik S.
,
Szeląg P.
,
Baran J.
,
Dudzik S.
,
Szeląg P.
,
Baran J.
International Journal of Electronics and Telecommunications
|
2020
|
vol.
66
|
issue
4
Page
/ 1
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