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Journals
4
International Journal of Electronics and Telecommunications
Years
3
2021
1
2017
Authors
4
Chernyshova M.
4
Czarski T.
4
Kasprowicz G.
4
Kolasinski P.
4
Linczuk P.
4
Wojenski A.
3
Gaska M.
3
Krawczyk R.
3
Zabolotny W.
2
Pozniak K.
1
Krawczyk R. D.
1
Malinowski K.
1
Mazon D.
1
Pozniak K. T.
1
Poźniak K. T.
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Full text local access
Feasibility of FPGA to HPC computation migration of plasma impurities diagnostic algorithms
100%
Poźniak K. T.
,
Linczuk P.
,
Chernyshova M.
,
Krawczyk R. D.
,
Zabolotny W.
,
Wojenski A.
,
Kolasinski P.
,
Kasprowicz G.
,
Czarski T.
International Journal of Electronics and Telecommunications
|
2017
|
vol.
63
|
issue
3
2
Full text local access
Soft X-ray Diagnostic System Upgrades and Data Quality Monitoring Features for Tokamak Usage
99%
Wojenski A.
,
Linczuk P.
,
Kolasinski P.
,
Chernyshova M.
,
Mazon D.
,
Kasprowicz G.
,
Pozniak K. T.
,
Gaska M.
,
Czarski T.
,
Krawczyk R.
,
Wojenski A.
,
Linczuk P.
,
Kolasinski P.
,
Chernyshova M.
,
Mazon D.
,
Kasprowicz G.
,
Pozniak K. T.
,
Gaska M.
,
Czarski T.
,
Krawczyk R.
International Journal of Electronics and Telecommunications
|
2021
|
vol.
67
|
issue
1
3
Full text local access
Zero-Suppression Trigger Mode for GEM Detector Measurement System
99%
Kolasinski P.
,
Pozniak K.
,
Wojenski A.
,
Linczuk P.
,
Krawczyk R.
,
Gaska M.
,
Zabolotny W.
,
Kasprowicz G.
,
Chernyshova M.
,
Czarski T.
,
Kolasinski P.
,
Pozniak K.
,
Wojenski A.
,
Linczuk P.
,
Krawczyk R.
,
Gaska M.
,
Zabolotny W.
,
Kasprowicz G.
,
Chernyshova M.
,
Czarski T.
International Journal of Electronics and Telecommunications
|
2021
|
vol.
67
|
issue
1
4
Full text local access
Measurement Capabilities Upgrade of GEM Soft X-ray Measurement System for Hot Plasma Diagnostics
86%
Linczuk P.
,
Wojenski A.
,
Kolasinski P.
,
Krawczyk R.
,
Zabolotny W.
,
Pozniak K.
,
Chernyshova M.
,
Czarski T.
,
Gaska M.
,
Kasprowicz G.
,
Malinowski K.
,
Linczuk P.
,
Wojenski A.
,
Kolasinski P.
,
Krawczyk R.
,
Zabolotny W.
,
Pozniak K.
,
Chernyshova M.
,
Czarski T.
,
Gaska M.
,
Kasprowicz G.
,
Malinowski K.
International Journal of Electronics and Telecommunications
|
2021
|
vol.
67
|
issue
1
Page
/ 1
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