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X-Ray Diffraction Investigations of NdGaO_{3} Single Crystal

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Mazur K., Sass J., Giersz W., Reiche P., Schell N.
Acta Physica Polonica A
|
1997
|
vol. 92
|
issue 1
226-230
EN
Neodymium gallium perovskite single crystals grown with the Czochralski method were examined with several complementary X-ray methods. By means of X-ray diffraction topography and reciprocal space diagram the structural perfection and crystal homogeneity of the studied wafers were determined. Additionally, the results of the X-ray reflectometry investigations of the surface perfection after the mechanochemical treatment are presented.
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