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X-Ray Resonant Magnetic Scattering: Application to Thin Films and Multilayers

100%
Raoux D., Jaouen N., Tonnerre J. M., Bontempi E.
Acta Physica Polonica A
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2000
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vol. 98
|
issue 5
483-494
EN
This paper reports on the use of a new technique to investigate the magnetic properties of thin films, multilayers and artificial structures, the X-ray resonant magnetic scattering at small values of the scattering vector. It can be used either by registering the reflectivity pattern or in a diffraction mode. In comparison with magneto-optical Kerr effect or neutron scattering, it offers an atomic selectivity due to the resonant excitation of a core electron, and even an electronic shell one. Examples are presented mainly in the soft X-range allowing to probe the 3d band of transition metals. They demonstrate the promising possibilities of the method to measure the magnetic moments carried by each of the atomic components in complex systems, as well as their distribution through thin layers, with an atomic resolution.
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Interpretation of Differential Anomalous X-Ray Scattering Data for Amorphous Cd-As

76%
Burian A., Lecante P., Mosset A., Galy J., Tonnerre J. M., Raoux D.
Acta Physica Polonica A
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1994
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vol. 86
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issue 4
633-640
EN
The computational procedure, based on Warren's exact method for an amorphous sample with more than one atom, was developed to obtain the short-range order structural parameters from the differential anomalous X-ray scattering data, collected using the synchrotron radiation. The experimental differential radial distribution functions were fitted with the true distribution functions expressed in an analytical form and broadened by convolution with the pair functions. It was found that atoms in the amorphous Cd-As films remain almost tetrahedrally coordinated and the investigated alloys are chemically ordered.
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