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Characterization of Epitaxial LSMO Films Grown on STO Substrates

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Španková M., Štrbík V., Chromik Š., Zheng D., Li J., Machajdík D., Kobzev A., Plecenik T., Sojková M.

Acta Physica Polonica A

2017

vol. 131

issue 4

848-850

Epitaxial manganite La_{0.67}Sr_{0.33}MnO₃ (LSMO) layers, with a thickness of 20-50 nm, are prepared on single crystal (001) SrTiO₃ (STO) substrates by pulsed laser deposition technique. Structural characterization (composition analysis, surface morphology), investigated by the Rutherford backscattering spectroscopy and atomic force microscopy, reveals the growth of stoichiometric LSMO films with a smooth surface (root-mean-square value of 0.21-1.6 nm). The prepared LSMO films possess high Curie temperature ( ≈ 412 K), low room temperature resistivity (1-2 mΩ cm) and maximum of temperature coefficient of resistivity TCR = 2.7% K¯¹ at 321 K.

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1 Acta Physica Polonica A

1 2017

1 Chromik Š.

1 Kobzev A.

1 Li J.

1 Machajdík D.

1 Plecenik T.

1 Sojková M.

1 Zheng D.

1 Španková M.

1 Štrbík V.

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Characterization of Epitaxial LSMO Films Grown on STO Substrates