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Scanning Tunnelling Spectroscopy of Periodic Nickel Nanoparticles

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Kamiński M., Susła B., Giersig M., Kandulski M.
Acta Physica Polonica A
|
2003
|
vol. 104
|
issue 3-4
351-356
EN
Scanning tunneling microscopy/spectroscopy as well as atomic force microscopy were applied to study the non-structural and nanoelectronic properties of periodic nickel nanoparticles deposited on n-silicon substrates. Periodic nickel (Ni) nanoparticles were prepared by using nanosphere lithography and analyzed by scanning tunneling microscopy/spectroscopy and atomic force microscopy. By the evaporation of Ni perfectly ordered nanoparticles were produced and very good correlation between latex mask was observed. Finally, tunneling spectroscopy performed with non-magnetic tip yield information about local electronic properties of nanoscale structures at surface.
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