A spectroscopic rotating polarizer-analyzer ellipsometer in which the polarizer and the analyzer rotate in opposite directions at the same speed and with a fixed retarder is proposed and investigated theoretically. The fixed phase retarder is introduced after the rotating polarizer to significantly reduce the percent error in the optical parameters.
We present theoretically the characterization of 100 nm SiO_2 thin film using spectroscopic rotating polarizer analyzer ellipsometer in which the two elements are rotating synchronously in opposite directions with the same angular speed. The proposed sample consists of air (ambient)/SiO_2 (thin film)/Si (substrate). The ellipsometric parameters ψ and Δ are calculated when a clean signal is received by the detector and when a hypothetical noise is imposed on this signal. The film thickness and the optical constants of the film are calculated for the noisy signal in the spectrum range 200-800 nm. The results are compared with the proposed thickness and with the published values for SiO_2 optical constants.
In this paper, dye sensitized solar cells were prepared using titanium dioxide (TiO₂) and natural dye extracted from purple carrot. The performance of dye sensitized solar cells was significantly improved through the pre- and post-treatments of the fluorinated tin oxide (FTO) glass substrate and the TiO₂ film using hydrochloric (HCl), phosphoric (H₃PO₄), and nitric (HNO₃) acids. The results showed that the pre-treatment of the FTO with H₃PO₄ and the post-treatment of TiO₂ with HNO₃ resulted in improved efficiencies of 130% and 250%, respectively.
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