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EN
PbTe and its solid solution (Pb,Cd)Te containing 2% of CdTe and PbTe grown by self-selecting vapour growth technique were investigated by inelastic X-ray scattering using synchrotron radiation. The ID28 beamline at ESRF with the incident photon energy of 17794 eV and the energy resolution of 3 meV was applied for that purpose. The measurements were performed at room temperature along [001]-type high symmetry direction in the Brillouin zone. In spite of a very low energy of phonon branches they can be determined by inelastic X-ray scattering with a high accuracy. The transversal acoustic phonon dispersion obtained by inelastic X-ray scattering corresponds well to those resulting from inelastic neutron scattering measurements and ab initio calculations. Apart from expected structures corresponding to the bulk phonons an additional scattering related to the crystal surface properties was observed in the inelastic X-ray scattering spectra. The analysis performed with the use of secondary ion mass spectroscopy technique demonstrated a presence of a thin oxide layer at sample surfaces.
EN
Single crystals of the (Pb,Cd)Te solid solution with CdTe content up to 9% were grown by self-selecting vapour growth method and investigated by powder X-ray diffraction, inelastic neutron scattering, and nanoindentation measurements. The analysis of the linear part of the LA phonon dispersion, determined by the inelastic neutron scattering demonstrated an increase of the sound velocity (thus the hardening of the crystal lattice) with an increase of CdTe content in the solid solution. An important increase of microhardness value for (Pb,Cd)Te was directly confirmed by results of nanoindentation measurements performed for a few samples with various chemical composition.
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