The E_{c}-0.22 eV trap in Horizontal Bridgman undoped n-type GaAs may be passivated by contact with phosphoric acid for 8 hours at room temperature. Isochronal annealing, at around 250°C for 1 hour resulted in the partial recovery of this defect. The possible mechanisms of E_{c}-0.22 eV trap passivation are proposed.
The photoluminescence and EPR measurements of neutron irradiated and annealed GaP samples are presented. Both methods confirm the presence of neutral Ge_{Ga}. The EPR spectrum gives also an indication of interstitial Ge.
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