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  1. 1 Acta Physica Polonica A

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  1. 1 2014

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  1. 1 Evans J.

  2. 1 Thiel P.

  3. 1 Ünal B.

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Temperature Dependence of Ag Film Roughening during Deposition on Quasicrystal and Approximant Surfaces

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Ünal B., Evans J., Thiel P.
Acta Physica Polonica A
|
2014
|
vol. 126
|
issue 2
608-612
EN
The temperature (T) dependence of roughening as assessed by scanning tunneling microscopy is compared for growth of Ag films on an 5-fold icosahedral Al-Pd-Mn quasicrystal surface and on an ξ'-approximant. Growth on the quasicrystal corresponds to a version of the Volmer-Weber growth, but modified by quantum size effects, and also by kinetic smoothening at low T and low coverages (θ). Growth on the approximant corresponds to a version of the Stranski-Krastanov growth modified by kinetic roughening at low T and low θ. For larger θ, i.e., for thicker films, distinct behavior is observed.
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