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Journals
2
Metrology and Measurement Systems
1
Bulletin of the Polish Academy of Sciences: Technical Sciences
Years
1
2020
1
2017
1
2014
Authors
1
Grzesik W.
1
Kucharski D.
1
Niemczewska-Wójcik M.
1
Sładek J.
1
Tabaka M.
1
Wójcik A.
1
Zdunek H.
1
Żak K.
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A low-cost, simple optical setup for a fast scatterometry surface roughness measurements with nanometric precision
100%
Kucharski D.
,
Zdunek H.
,
Kucharski D.
,
Zdunek H.
Bulletin of the Polish Academy of Sciences: Technical Sciences
|
2020
2
Full text local access
Metrological Aspects of Surface Topographies Produced by Different Machining Operations Regarding Their Potential Functionality
100%
Grzesik W.
,
Żak K.
Metrology and Measurement Systems
|
2017
|
vol.
24
|
issue
2
3
Full text local access
Product Quality Assessment – Measurement and Analysis of Surface Topography
100%
Niemczewska-Wójcik M.
,
Sładek J.
,
Tabaka M.
,
Wójcik A.
Metrology and Measurement Systems
|
2014
|
issue
2
Page
/ 1
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