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Second order reflection from crystals used in soft X-ray spectroscopy

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Książek I.
Nukleonika
|
2015
|
vol. 60
|
issue 2
263-265
EN
In this note the ratio of the second to the first order reflection is determined for the KAP and PbSt crystals, for wavelengths corresponding to the Al K-line emission. The source of the radiation was a low-voltage stabilized X-ray tube. The X-rays were detected with a Bragg spectrometer equipped with a proportional counter detector. The signal measured by the proportional counter was subsequently pulse height analyzed.
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Wideband spectral emission measurements from laser-produced plasma EUV/SXR source based on a double gas puff target

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Arikkatt A. J., Wachulak P., Fiedorowicz H., Bartnik A., Czwartos J., Arikkatt A. J., Wachulak P., Fiedorowicz H., Bartnik A., Czwartos J.
Metrology and Measurement Systems
|
2020
|
vol. 27
|
issue 4
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