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Multiaxis interferometric displacement measurement for local probe microscopy

100%
Lazar J., Hrabina J., Šerý M., Klapetek P., Číp O.
Open Physics
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2012
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vol. 10
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issue 1
225-231
EN
We present an overview of design approaches for nanometrology measuring setups with a focus on interferometry techniques and associated problems. The design and development of a positioning system with interferometric multiaxis monitoring and control is presented. The system is intended to operate as a national nanometrology standard combining local probe microscopy techniques and sample position control with traceability to the primary standard of length.
2
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Intensification of heat transfer between heat exchange surfaces at low RE values

100%
Cernecky J., Brodnianska Z., Koniar J.
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issue 3
331-344
EN
This contribution deals with the heat transfer parameters and pressure losses in heat exchange sets with six geometrical arrangements at low Re values (Re from 476 to 2926). Geometrical arrangements were characterised by the h/H ratio ranging from 0.2 to 1.0. The experiments used the holographic interferometry method in real time. This method enables visible and quantitative evaluations of images of temperature fields in the examined heat exchange. These images are used to determine the local and mean heat transfer parameters. The obtained data were used to determine the Colburn j-factor and the friction coefficient f. The measured values show that by using the profiled heat exchange surfaces and inserting regulating tubes, an intensification of heat transfer (increase of Num, and/or j) was achieved. However, pressure losses recorded a significant increase (increase of f).
3
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Measurement System Based on Multi-Wavelength Interferometry for Long Gauge Block Calibration

100%
Wengierow M., Salbut L., Ramotowski Z., Szumski R., Szykiedans K.
Metrology and Measurement Systems
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2013
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issue 3
4
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Intensification of heat transfer between heat exchange surfaces at low RE values

88%
Cernecky J., Brodnianska Z., Koniar J.
Chemical and Process Engineering
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2015
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issue 3
5
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Fibre-optic sensor for simultaneous measurement of thickness and refractive index of liquid layers

88%
Marzejon M., Karpienko K., Mazikowski A., Jędrzejewska-Szczerska M., Marzejon M., Karpienko K., Mazikowski A., Jędrzejewska-Szczerska M.
Metrology and Measurement Systems
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2019
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vol. 26
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issue 3
6
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Quasi-distributed network of low-coherence fiber-optic Fabry–Pérot sensors with cavity length-based addressing

88%
Karpienko K., Marzejon M. J., Mazikowski A., Plucinski J., Karpienko K., Marzejon M. J., Mazikowski A., Plucinski J.
Metrology and Measurement Systems
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2021
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vol. 28
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issue 2
7
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Laser Reflectance Interferometry System with a 405 Nm Laser Diode for in Situ Measurements of CVD Diamond Thickness

75%
Kraszewski M., Bogdanowicz R.
Metrology and Measurement Systems
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2013
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issue 4
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