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Journals
3
Metrology and Measurement Systems
Years
1
2014
2
2013
Authors
3
Lentka G.
1
Hoja J.
1
Kowalewski M.
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Using A Particular Sampling Method for Impedance Measurement
100%
Lentka G.
Metrology and Measurement Systems
|
2014
|
issue
3
2
Full text local access
A Family of New Generation Miniaturized Impedance Analyzers for Technical Object Diagnostics
100%
Hoja J.
,
Lentka G.
Metrology and Measurement Systems
|
2013
|
issue
1
3
Full text local access
Fast High-Impedance Spectroscopy Method Using Sinc Signal Excitation
88%
Kowalewski M.
,
Lentka G.
Metrology and Measurement Systems
|
2013
|
issue
4
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/ 1
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