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Journals
1
Archives of Electrical Engineering
1
Metrology and Measurement Systems
Years
1
2013
1
2011
Authors
1
Crevecoeur G.
1
Dudzik S.
1
Dupré L.
1
Gawrylczyk K.
1
Putek P.
1
Slodička M.
1
van Keer R.
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in the keywords: defect characterization
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Characterization of Material Defects Using Active Thermography and an Artificial Neural Network
100%
Dudzik S.
Metrology and Measurement Systems
|
2013
|
issue
3
2
Full text local access
Two-level approach for solving the inverse problem of defects identification in Eddy Current Testing - type NDT
86%
Putek P.
,
Crevecoeur G.
,
Slodička M.
,
Gawrylczyk K.
,
van Keer R.
,
Dupré L.
Archives of Electrical Engineering
|
2011
|
vol.
60
|
issue
4
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/ 1
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