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Journals
3
Metrology and Measurement Systems
1
Archives of Electrical Engineering
Years
1
2020
1
2012
1
2011
1
2010
Authors
2
Shi Y.
2
Zhang W.
1
Ao Y.
1
Cui J.
1
Huang C.
1
Li X.
1
Li Y.
1
Wang H.
1
Wang Y.
1
Zhou L.
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Full text local access
Fault diagnosis of analog circuit based on wavelet transform and neural network
100%
Wang H.
,
Wang H.
Archives of Electrical Engineering
|
2020
|
vol.
69
|
issue
1
2
Full text local access
A Novel Method of Handling Tolerances for Analog Circuit Fault Diagnosis Based on Normal Quotient Distribution
100%
Ao Y.
,
Shi Y.
,
Zhang W.
,
Li X.
Metrology and Measurement Systems
|
2012
|
issue
4
3
Full text local access
Analog Circuit Fault Classification Using Improved One-Against-One Support Vector Machines
86%
Cui J.
,
Wang Y.
Metrology and Measurement Systems
|
2011
|
issue
4
4
Full text local access
Soft-Fault Diagnosis of Analog Circuit with Tolerance Using FNLP
86%
Zhang W.
,
Zhou L.
,
Shi Y.
,
Huang C.
,
Li Y.
Metrology and Measurement Systems
|
2010
|
issue
3
Page
/ 1
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