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1

Surface Nanofeatures Induced by High-Energy Heavy Ions Irradiation

100%

García-Bórquez A., Camacho-Olguín C., Herrera-Colín L., Rueda-Morales G., Kesternich W.

Acta Physica Polonica A

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2006

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vol. 109

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issue 3

347-351

EN

During neutron, ions or electron irradiation of materials, the surface morphology can be microroughened in different forms. Using a tandem accelerator with high current capability, 3.66 MeV Ni and Al ions were implanted into Ni-22at%Si alloy at 650ºC and intoα-Al_2O_3 at 1000ºC, respectively. Scanning electron microscopy observation revealed surface nanofeatures induced by the irradiations. On the Ni--Si alloy, long parallel channels are formed having a periodicity near to 2μm and a mean depth of 30 nm (atomic force microscopy measurements). Onα-Al_2O_3 nanopyramides with around 50 nm basis length and similar height were detected on some grains forming periodic chains. We assume that preferential sputtering produced both induced surface features.

2

Scanning Tunneling Microscopy of Ordered Organic Monolayer Films on Si(001)

80%

Hamers R., Hovis J., Liu H.

Acta Physica Polonica A

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1998

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vol. 93

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issue 2

289-295

EN

Scanning tunneling microscopy and optical spectroscopy techniques have been utilized to investigate the formation of ordered organic monolayer films on the (001) face of silicon. Cyclopentene and 1,5-cyclooctadiene both produce monolayer films that are ordered translationally and rotationally. The rotational orientations of the molecules arise from the directional interaction of the π orbitals of the starting alkene with the π orbital of the dimers comprising the reconstructed Si(001) surface, with the Si(001) surface acting as a template for determining the directionality of molecules in the subsequent organic film. Using single-domain Si(001) samples, it is shown that the molecular films also exhibit anisotropy in optical properties when measured on centimeter length scales.

3

Measurements of the Diffusion and Reflection Coefficients of Cd(^1S_0) in Noble Gases

80%

Rudecki P., Domysławska J.

Acta Physica Polonica A

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2003

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vol. 104

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issue 6

589-600

EN

A new method of simultaneous determining of the diffusion coefficient and the reflection coefficient of atoms from the reservoir walls is presented. The diffusion coefficient of cadmium atoms in the ground state in buffer noble gas atoms such as Ne, Ar, Kr, and Xe and reflection coefficient of Cd atoms from the quartz cell wall in the temperature range 350-550 K were determined. Experimental values of diffusion coefficient are compared with theoretical ones calculated from available potentials.

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3 Acta Physica Polonica A

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1 Kesternich W.

1 Liu H.

1 Rudecki P.

1 Rueda-Morales G.

Surface Nanofeatures Induced by High-Energy Heavy Ions Irradiation

Scanning Tunneling Microscopy of Ordered Organic Monolayer Films on Si(001)

Measurements of the Diffusion and Reflection Coefficients of Cd(^1S_0) in Noble Gases