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Journals
2
Metrology and Measurement Systems
Years
1
2015
1
2014
Authors
2
Kolek A.
1
Ciura Ł.
1
Dziedzic A.
1
Gawron W.
1
Kowalewski A.
1
Stadler A. W.
1
Stanaszek D.
1
Zawiślak Z.
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Full text local access
Noise Measurements Of Resistors With The Use Of Dual-Phase Virtual Lock-In Technique
100%
Stadler A. W.
,
Kolek A.
,
Zawiślak Z.
,
Dziedzic A.
Metrology and Measurement Systems
|
2015
|
vol.
22
|
issue
4
2
Full text local access
Measurements of Low Frequency Noise of Infrared Photo-Detectors with Transimpedance Detection System
72%
Ciura Ł.
,
Kolek A.
,
Gawron W.
,
Kowalewski A.
,
Stanaszek D.
Metrology and Measurement Systems
|
2014
|
issue
3
Page
/ 1
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