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Gwyddion: an open-source software for SPM data analysis

100%
Open Physics
|
2012
|
vol. 10
|
issue 1
181-188
EN
In this article, we review special features of Gwyddion-a modular, multiplatform, open-source software for scanning probe microscopy data processing, which is available at http://gwyddion.net/. We describe its architecture with emphasis on modularity and easy integration of the provided algorithms into other software. Special functionalities, such as data processing from non-rectangular areas, grain and particle analysis, and metrology support are discussed as well. It is shown that on the basis of open-source software development, a fully functional software package can be created that covers the needs of a large part of the scanning probe microscopy user community.
EN
This article presents results of near-field scanning optical microscope measurement of local luminescence of rhodamine 3B intercalated in montmorillonite samples. We focus on how local topography affects both the excitation and luminescence signals and resulting optical artifacts. The Finite Difference in Time Domain method (FDTD) is used to model the electromagnetic field distribution of the full tip-sample geometry including far-field radiation. Even complex problems like localized luminescence can be simulated computationally using FDTD and these simulations can be used to separate the luminescence signal from topographic artifacts.
EN
Adsorption of human plasma fibrinogen, osteoblasts, and fibroblasts on differently treated titanium samples as implants were examined in this study. Titanium samples were mechanically polished, chemically etched (with and without surface material loss), and grinded. The main goal of this study is to find the best surface treatment of titanium for its possible use as implants. Atomic force microscopy was used to evaluate the adsorption of human plasma fibrinogen onto the titanium samples. Cell counting was used to determine the adherability of osteoblasts and fibroblasts on the titanium samples. Our preliminary results show that the etched titanium surface with surface material loss is the best surface treatment used in our experiments.
EN
We present an overview of design approaches for nanometrology measuring setups with a focus on interferometry techniques and associated problems. The design and development of a positioning system with interferometric multiaxis monitoring and control is presented. The system is intended to operate as a national nanometrology standard combining local probe microscopy techniques and sample position control with traceability to the primary standard of length.
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