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Neutron Reflectometry Studies of Thin Films and Multilayered Materials

100%
Majkrzak C.
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vol. 96
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issue 1
81-99
EN
Neutron reflectometry is an important technique for studying the composition and structure of thin films and layered media on a nanometer scale. Neutrons are particularly useful as probes of organic and magnetic materials since the information that can be obtained is often unique. Furthermore, the fact that neutrons traverse relatively large distances in single crystalline materials, such as silicon, permit investigations in diverse sample environments. The fundamental theoretical principles and experimental methodology of neutron reflectometry are presented, in addition to several illustrative examples of measurements relevant to polymer science, biology, electrochemistry, and magnetism.
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Interlayer Coupling in EuS-Based Superlattices Deduced from Neutron Scattering Experiments

39%
Sankowski P., Kępa H., Kacman P., Sipatov A., Majkrzak C., Giebultowicz T.
Acta Physica Polonica A
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2004
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vol. 105
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issue 6
607-614
EN
The ferromagnetic/diamagnetic semiconductor superlattices, EuS/PbS and EuS/YbSe, were studied by neutron reflectivity. In order to determine the strength of the interlayer coupling, the intensity of the first magnetic Bragg peak vs. applied external magnetic field was measured. Additionally, the in-plane anisotropy and the domain structure were studied by polarized neutron reflectivity. The dependence of the intensity of the antiferromagnetic neutron reflectivity peak vs. magnetic field was simulated using a Stoner-Wohlfarth model. To reproduce the observed spectra it was necessary to take into account the presence of fluctuations of the nonmagnetic layers thickness, by assuming a Gaussian spread of the interlayer coupling constant $J$. For both EuS/PbS and EuS/YbSe superlattices, the best fit was obtained for the directions of the in-plane easy axes, which agree with those determined by polarized neutron reflectivity.
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