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EN
In this study, K_{β}/K_{α} X-ray intensity ratios of zinc in pure zinc, undoped ZnO thin film and boron and fluorine-doped ZnO thin films have been investigated. These samples have been excited by 59.5 keV γ-rays from a ^{241}Am annular radioactive source. K X-rays emitted by the samples have been counted using an Ultra-LEGe detector with a resolution of 150 eV at 5.9 keV. The K_{β}/K_{α} X-ray intensity ratios of the doped ZnO thin films have been compared with that of the undoped ZnO thin film. The deviations between the results can be explained by delocalization and/or charge transfer phenomena causing change in valence electronic configuration of zinc.
EN
The L_{3l}, L_{3α}, L_{3β}, L_{2β}, L_{2γ}, L_{2η}, L_{1β} and L_{1γ} X-ray production cross-sections and L shell average fluorescence yields were measured for the elements from Re to U using excitation energy of 123.6 keV. Measurements were performed using an ^{57}Co annular radioactive source and a Si(Li) detector. The theoretical values of the cross-sections were calculated using theoretically tabulated values of subshell photoionization cross-sections;the Coster-Kronig transition probabilities were based on the Dirac-Hartree-Slater theory and radiative emission rates. Experimental results were compared with the theoretically calculated values of L shell X-ray cross-sections. The present experimental results are in agreement with theoretical values.
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