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EN
In this study, the Raman microscopy technique was employed for identifying a multi-pigmented surface from the wall decorations of the Theban tomb (TT277), Luxor, Egypt. The Raman spectra were collected in the near infrared excitation line (785 nm Linefocus) of a diode laser source which enables mapping scan of specific areas in only few minutes. The microstructure and microanalysis of samples were performed by the aid of an environmental scanning electron microscopy coupled with an energy dispersive X-ray analysis system. The identified pigments were red ochre (haematite), yellow ochre (goethite) and carbon black (from a vegetable origin). Traces of anatase were found in the yellow coloured areas which can be a contaminant in natural iron oxide deposits. The ground layer was identified as anhydrite with minor amounts of calcium carbonates detected in some samples. The results showed the capability of the Raman microscopy for direct and fast identification of multi-pigmented surfaces in wall paintings and other decorative objects.
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