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Journals
2
Metrology and Measurement Systems
Years
1
2016
1
2012
Authors
2
Blakiewicz G.
2
Jakusz J.
2
Jendernalik W.
1
Kłosowski M.
1
Piotrowski R.
1
Szczepański S.
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Full text local access
A High-Efficient Low-Voltage Rectifier for CMOS Technology
100%
Jendernalik W.
,
Jakusz J.
,
Blakiewicz G.
,
Kłosowski M.
Metrology and Measurement Systems
|
2016
|
vol.
23
|
issue
2
2
Full text local access
Characteristics of an Image Sensor with Early-Vision Processing Fabricated in Standard 0.35 μm Cmos Technology
88%
Jendernalik W.
,
Jakusz J.
,
Blakiewicz G.
,
Szczepański S.
,
Piotrowski R.
Metrology and Measurement Systems
|
2012
|
issue
2
Page
/ 1
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