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EN
The aim of undertaken long-term studies of the elemental composition of human serum, urine, and hair is to define reference values of elements concentration. For this purpose the total reflection X-ray fluorescence method was applied to determination of several elements concentration in human serum, urine and hair (S, K, Ca, Fe, Cu, Zn, Br, P, Cr, and Rb in serum samples; Fe, Cu, Zn, Rb, Cr, Mn, and Sr in urine samples; S, K, Ca, Fe, Cu, Br, Zn, Cl, Ti, Cr, Mn, Ni, and Se in hair samples) in the range of concentration from ppb to several hundred ppm. The method of selection of the control group, the experimental setup and its calibration procedure are described. We also present sample preparation methods and procedure of measurements.
EN
The results of the elemental and chemical composition analysis of human medical samples (blood, serum, hair, urine, tooth, kidney stones, gallstones) and environmental samples (slag, cereal, vegetables, flour, pork bones, pork meat, fish) are presented. The analysis were performed by application of the total reflection X-ray fluorescence, wavelength dispersive X-ray fluorescence and X-ray powder diffraction methods. With X-ray fluorescence methods the following elements were identified: O, Na, Mg, Al, Si, P, S, Cl, K, Ca, Ti, Mn, Fe, Ni, Cu, Zn, Se, Br, Rb, Sr, Zr, I, Ba, and Pb, whose concentrations were from a few ng/g to tens of percent. For some samples the elemental analysis was extended by X-ray powder diffraction measurements. With this method the chemical composition was determined. In the paper the experimental setups, methodology of samples preparation and methods of carrying out the measurements are described. As an example the X-ray spectra registered for gallstone sample are discussed in detail. Finally, the results of X-ray diffraction and elemental analysis for selected medical and environmental samples are summarized.
EN
X-ray reflectometry and spectroscopic ellipsometry methods were applied for determination of physical properties of gold nonolayers. The nanolayers were prepared by sputtering of gold on different substrates: borosilicate glass, polished crystalline quartz and crystalline silicon. With X-ray reflectometry technique roughness of the substrates and density, thickness and roughness of gold layers were determined. The results showed decrease in density of the gold layers due to their nanometer thickness and that roughness of the underlayer affects roughness of the gold layer. In addition, thicknesses of the gold layers measured with spectroscopic ellipsometry turned out to be in agreement, within the experimental uncertainty, with results of the X-ray reflectometry method.
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