New calculations of resistivities of liquid metals, Na, K, Rb, and alloys, Na-K, Na-Rb, K-Rb, were carried out by using a variant of the Kubo formula that explicitly contains the temperature T. The results come closer to the experiment than the previous ones that use the Ziman formula of resistivity.
The temperature (T) dependence of roughening as assessed by scanning tunneling microscopy is compared for growth of Ag films on an 5-fold icosahedral Al-Pd-Mn quasicrystal surface and on an ξ'-approximant. Growth on the quasicrystal corresponds to a version of the Volmer-Weber growth, but modified by quantum size effects, and also by kinetic smoothening at low T and low coverages (θ). Growth on the approximant corresponds to a version of the Stranski-Krastanov growth modified by kinetic roughening at low T and low θ. For larger θ, i.e., for thicker films, distinct behavior is observed.
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