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Silver selenide modification of polyamide fabric

100%
Milašienė D., Ivanauskas R.
Open Chemistry
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2013
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vol. 11
|
issue 12
1976-1980
EN
Formation of a silver selenide layer on silicone coated polyamide cloth was investigated. Fabric samples were selenized in potassium selenotrithionate (K2SeS2O6) solution then treated with AgNO3 solution. Formation of a silver selenide particle layer on the surface was confirmed by a change in appearance, X-ray diffraction, and EDX analysis. XRD revealed two phases: orthorhombic naumannite (Ag2Se) and monoclinic selenium (Se8). SEM showed that the fabric macrostructure and the multifilament yarn microstructure was preserved. The silver selenide particles ranged from 100 nm to more than 20 µm. [...]
2
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Formation and properties of copper chalcogenides thin films on polymers formed using sodium telluropentathionate

100%
Šukytė J., Ivanauskas R.
Open Chemistry
|
2013
|
vol. 11
|
issue 7
1163-1171
EN
The preparative conditions were optimized to get chalcogens layers on the polymer - polyamide PA surface by sorption at room temperature using sodium telluropentathionate, Na2TeS4O6. Further interaction of chalcogenized dielectric with copper’s (I/II) salt solution leads to the formation of mixed CuxSy-CuxTey layers. Optical, electrical and surface characteristics of the layers are highly controlled by the deposition parameters. The stoichiometry of these layers was established by UV-Visible and AA spectrometry. Optical absorption (transmittance) experiments show the samples are of high optical quality. The band gaps of thin films were obtained from their optical absorption spectra, which were found in the range of 1.44–2.97 eV. XRD was used in combination with AFM to characterize chalcogenides layers’ structural features. XRD analysis confirmed the formation of mixed copper chalcogenides’ layers in the surface of PA with binary phases such as Cu2Te, Cu3.18Te2, copper telluride, Cu2.72Te2, vulcanite, CuTe, anilite, Cu7S4 and copper sulfide, Cu1.8S. The crystallite sizes of thin films calculated by the Scherer formula were found to be in the range of 3.07–13.53 nm for CuxSy crystallites and 4.06–20.79 nm for CuxTey crystallites. At room temperature an electrical resistance of CuxSy-CuxTey layers varies from 3.0×103 kΩ□−1 to 1.0 kΩ□−1. [...]
3
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Comparison of the efficacy of sulfurization agents in decreasing the sheet resistance of polyamide and polyethylene with copper sulfide layers and influence of their compositions

81%
Ivanauskas R., Ancutienė I., Janickis V., Stokienė R.
Open Chemistry
|
2009
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vol. 7
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issue 4
864-869
EN
The process of obtaining semiconductive and electrical conductive layers of copper sulfides by the sorption - diffusion method on polymers (polyamide 6 and low density polyethylene) using solutions of potassium pentathionate, K2S5O6, and higher polythionic acids, H2Sn O6 (n = 21, 33), was investigated. The layers were characterized for compositional and electrical properties by X-ray diffraction (XRD) analysis and sheet resistance measurements. The thickness of copper sulfides layers on polyamide and polyethylene increased with increasing time of polymer sulfurization and varied from 10 to 43 µm. The variations of the sheet resistance of copper sulfides layers formed on the surface of polymers on sulfurization agent used, the conditions of sulfurization, chemical and phase composition of the obtained layers were established. Sheet resistance of copper sulfides layers decreases with increasing time of the duration of sulfurization and the number of sulfur atoms in the polythionate anion. The sheet resistance values for copper sulfide layers formed on the polyamide surface are much lower than those of Cux S formed on the polyethylene surface. XRD showed the predomination of Cux S phases with low x values. [...]
4
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Comparison characterization of copper selenide thin layers prepared on polyamide 6 films by sorption-diffusion method

81%
Ivanauskas R., Janickis V., Jasulaitienė V.
Open Chemistry
|
2013
|
vol. 11
|
issue 4
636-643
EN
Some earlier synthesized copper selenide (Cux Se) layers formed on the surface of polyamide 6 by sorption-diffusion method using potassium selenotrithionate (K2SeS2O6) as precursor of selenium were characterized by the XRD, XPS and SEM methods. According to the results of the SEM studies, the most uniform Cux Se layers form at the 2.5 h polyamide seleniumized duration at the temperature of 60°C. The thickness of layers, which dependeds on the duration of seleniumization, changed in the range of 0.8–3.2 µm. The XRD patterns of not previously studied Cux Se layers showed their phase composition of six copper selenides: Cu2Se, two phases of CuSe2, Cu3Se2, berzellianite, Cu2-x Se, and bellidoite Cu2Se. Analysis of the XRD and XPS data shows that the macrostructure and composition of the CuxSe layers depend on the conditions of formation of these layers. [...]
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