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Journals
2
Metrology and Measurement Systems
Years
1
2017
1
2013
Authors
2
Kraszewski M.
1
Bogdanowicz R.
1
Gardas M.
1
Gnyba M.
1
Głowacki M. J.
1
Strąkowska P.
1
Strąkowski M. R.
1
Trojanowski M.
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Full text local access
Laser Reflectance Interferometry System with a 405 Nm Laser Diode for in Situ Measurements of CVD Diamond Thickness
100%
Kraszewski M.
,
Bogdanowicz R.
Metrology and Measurement Systems
|
2013
|
issue
4
2
Full text local access
Examination of Sol-Gel Derived Hydroxyapatite Enhanced with Silver Nanoparticles using OCT and Raman Spectroscopy
61%
Głowacki M. J.
,
Gnyba M.
,
Strąkowska P.
,
Gardas M.
,
Kraszewski M.
,
Trojanowski M.
,
Strąkowski M. R.
Metrology and Measurement Systems
|
2017
|
vol.
24
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issue
1
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/ 1
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