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Microhardness and the Young Modulus of Thin, MBE-Grown, (Sn,Mn)Te Layers Containing up to 8% of Mn

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Adamiak S., Zięba M., Minikayev R., Reszka A., Taliashvili B., Szuszkiewicz W.

Acta Physica Polonica A

2017

vol. 132

issue 2

347-350

The thin layers of (Sn,Mn)Te solid solution were grown by molecular beam epitaxy onto (111)-oriented BaF₂ substrates and characterized by scanning electron microscopy, atomic force microscopy, energy dispersive X-ray spectrometry, and X-ray diffraction methods. The epitaxial character of the growth was confirmed. All the layers exhibited a regular (fcc) structure of the rock-salt type and were (111)-oriented, their thickness was close to about 1 μm. The layers contained up to 8% of Mn. The microhardness and the Young modulus values were determined by the nanoindentation measurements. The Berkovich type of the intender was applied, the maximum applied load was equal to 1 mN. The results of measurements demonstrated a lack of the composition dependence of the Young modulus value. A slight increase of the microhardness value with an increasing Mn content in the (Sn,Mn)Te solid solution was observed.

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1 Acta Physica Polonica A

1 2017

1 Adamiak S.

1 Minikayev R.

1 Reszka A.

1 Szuszkiewicz W.

1 Taliashvili B.

1 Zięba M.

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Microhardness and the Young Modulus of Thin, MBE-Grown, (Sn,Mn)Te Layers Containing up to 8% of Mn