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Inner Size Effect in Layered Films with Eutectic Interaction of Components

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Dukarov S., Petrushenko S., Sukhov V., Churilov I., Samsonik A., Skryl O.
Acta Physica Polonica A
|
2018
|
vol. 133
|
issue 5
1186-1190
EN
The results of the study of melting of Bi-Sn and Pb-Sn polycrystalline layered film systems with the thickness of 200-400 nm on a substrate with temperature gradient are given. Multilayer (each layer is of 10-20 nm) and bilayer films (layers are of 100-200 nm) of the same total thickness have been investigated. Broadening of the melting range in all films and lowering of melting point in multilayer samples compared to the bilayer ones have been observed. The observed phenomena are discussed within existing thermodynamic concepts in consideration of interfacial energy of contacting layers of components and energy of grain boundaries in polycrystalline films.
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