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EN
Nanocrystalline CdO thin films were prepared by sol-gel dip-coating method using a different solution. The as-deposited films were subjected to drying temperature of 120° in air. The prepared films were annealed in different temperatures of 200, 300 and 400°C. The characterization of samples was carried out by X-ray diffraction, scanning electron microscopy and UV-VIS spectroscopy. Results show that the samples are polycrystalline in nature and the crystallinity of the films improves with temperature. The average grain size is in the range of 19-34 nm. It was observed that the optical parameters of the films were affected by annealing temperature.
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issue 4
659-664
EN
The ZnO thin films were prepared from zinc acetate dihydrate as main precursor by using sol-gel method and deposited by drainage and dip coating technique. Four different routes and coating techniques were used for the preparation of samples. The morphology, optical, and structural properties of the sol-gel made ZnO thin films were studied with respect to the preparation of sol-gel route, drainage and dip coating technique. The microstructure of the ZnO thin films and the powders were analyzed by X-ray diffraction. The ZnO thin films prepared in this study were amorphous while its powders were polycrystalline with various diffraction peaks in the X-ray diffraction patterns. The morphology of the film was examined by using scanning electron microscopy. The surface morphology of the ZnO thin films strongly depends on preparation route and deposition technique. The optical characteristics of the samples were obtained by using UV-Visible spectrophotometer at 200-900 nm wavelength. The optical constants (refractive index, extinction coefficient etc.) of the ZnO thin films depend on preparation conditions. The photoluminescence spectra of the ZnO films show the band-edge and sub-band transitions.
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