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Bulletin of the Polish Academy of Sciences: Technical Sciences
Years
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2010
Authors
1
Hetaba W.
1
Häusler I.
1
Kirmse H.
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Mogilatenko A.
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Neumann W.
1
Zheng C.
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Advanced microstructure diagnostics and interface analysis of modern materials by high-resolution analytical transmission electron microscopy
100%
Neumann W.
,
Kirmse H.
,
Häusler I.
,
Mogilatenko A.
,
Zheng C.
,
Hetaba W.
Bulletin of the Polish Academy of Sciences: Technical Sciences
|
2010
|
issue
2
Page
/ 1
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