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EN
Thermally stimulated luminescence of X-ray irradiated β -Ga₂O₃ thin films was investigated. An analysis of the form of the elementary contours making the thermally stimulated luminescence curves shows that recombination processes at the thermally stimulated luminescence peaks with maxima at 77, 135, 178, and 235 K in thin films of β -Ga₂O₃ are described in terms of linear kinetics. The spectral composition of the thermally stimulated luminescence of the thin films was studied. Some methods are employed to determine the activation energies and frequency factors corresponding to the thermally stimulated luminescence peaks. It is established that the recombination processes occurring upon release of the trapping centers in thin films β -Ga₂O₃ are conditioned by diffusion-controlled tunneling recombination due to thermally-stimulated migration of V_{k}-centers.
EN
The structure of the surface and spectra of the cathodoluminescence of Y₂O₃:Eu thin films when changing the activator concentration in the range 1.0-7.5% by mole obtained by RF sputtering were investigated. On the base of the shape of the cathodoluminescence spectra at different concentrations of the activator, the possibility of irregular solutions creating of yttrium and europium oxides and the structural features of the small and large crystallites forming the film Y₂O₃:Eu is shown. The dependence of the cathodoluminescence intensity on the energy of the exited electrons and current density of electron irradiation was established.
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