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Application of the TOF-SIMS and SEM-EDS methods to assess the influence of dusting from a phosphate waste deposal place based on hair analysis

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Szynkowska M., Leśniewska E., Pawlaczyk A., Rogowski J., Paryjczak T.
Polish Journal of Chemical Technology
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2007
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vol. 9
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issue 4
85-90
EN
In this work, scanning electron microscopy with energy dispersive X-ray spectrometry (SEM-EDS) and the time-of-flight secondary ion mass spectrometry (TOF-SIMS) were used to study the particles present on the hair surface of the inhabitants of Wislinka (people environmentally exposed due to the closeness of a dump) in order to obtain the information about the possible influence of dusting from a phosphate waste deposal place. Additionally, the morphology and the composition of fresh phosphogypsum were analyzed. Waste phosphogypsum is formed in the process of a wet phosphoric acid production and there is still a problem with its storage. A thorough understanding of the composition and chemistry of phosphogypsum seems to be necessary to evaluate its environmental impact comprehensively. The results obtained from these two techniques turned out to be complementary and revealed the information expected.
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