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Journals
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Bulletin of the Polish Academy of Sciences: Technical Sciences
Years
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2006
Authors
1
Gotszalk T.
1
Grabiec P.
1
Janus P.
1
Kolanek K.
1
Marendziak A.
1
Rangelow I. W.
1
Szeloch R.
1
Zaborowski M.
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Scanning probe microscopy as a metrology method in microand nanostructure investigations
100%
Gotszalk T.
,
Marendziak A.
,
Kolanek K.
,
Szeloch R.
,
Grabiec P.
,
Zaborowski M.
,
Janus P.
,
Rangelow I. W.
Bulletin of the Polish Academy of Sciences: Technical Sciences
|
2006
|
vol.
54
|
issue
1
Page
/ 1
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